The OAI Single Long Pulse Solar Simulator and I -V Test System is designed specifically for High Efficiency Solar Cells. This test system overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely precise measurements of solar cell efficiency leading to more accurate binning and increased profitability.
Advances in mono-crystalline Si, multi -crystalline Si, HIT, and backside -contact type based solar cell design have led to an increase in cell capacitance and resistance by >2 orders of magnitude. This results in a decrease in the cell’s dielectric response speed. Most flash testers provide extremely short pulse duration, and require fast voltage sweep rates. By testing solar cells with flash testers, the results can give inconsistent fill-factor values and lower cell efficiency measurements.
High Efficiency Cells require a pulse width in the range of ˜ 75 -200ms and a working range of <15V/sec voltage sweep rates, creating a significant challenge for flash test systems to accurately determine the performance of these advanced cells. OAI’s new Single Long Pulse Solar Simulator & I -V Test System overcomes these limitations and provides exceptionally accurate measurements for High Efficiency Solar Cells. Perfect for both R&D and production, this test system solves the unique measurement challenges of High Efficiency and High Capacitance Solar Cells by providing an optimized long pulse width and voltage sweep rate combined with a unique algorithm. The result is accurate measurement of the I&V curve and the ability to ascertain the true fill-factor and efficiency of a solar cell.