I-V Test Systems – OAI

Service and Support

atomic — Thu, 09 Sep 2021 02:53:08 +0000

We invite you to consider OAI as your technology partner. OAI combines innovative design and manufacturing expertise with a level of customer service and support that is unmatched in the industry. We offer complete product and engineering/application service and support to make your unique process more successful, more efficient, and less costly. Contact an experienced OAI customer support expert today regarding your particular need.

Do you require service for one of your OAI products or do you have a question about one of our products? Tap the Service and Support button at the right, fill in the details, and we will get back to you right away!

Standard and Custom Test Fixtures

atomic — Thu, 09 Sep 2021 02:53:07 +0000

Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I-V tester. Fixture configurations range from simple hold down devices to temperature-controlled fixtures with frontside and backside contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I-V Tester and Solar Simulator.

I-V Test Systems

atomic — Thu, 09 Sep 2021 02:53:07 +0000

OAI offers a complete line of high performance I-V Testers. I-V Testers and I-V Rider software may be ordered as a stand-alone system or integrated into any OAI Solar Simulator. Three standard ranges of I-V Testers are available: ≤1A, 1-5A, 5-10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to ensure that the I-V Tester and I-V Rider software you choose is optimized for your specific application.

Parameters Tested:

Open-circuit voltage (OCV)
Short-circuit current (lsc)
Maximum power output of the cell (Pmax)
Voltage at Pmax (Vmp)
Current at Pmax (Ipm)
Conversion efficiency
Fill factor (FF)
Series Resistance (Rs)
Shunt Resistance (Rsh)

Automated I-V/AOI/EL and Sorting System

atomic — Thu, 09 Sep 2021 02:53:07 +0000

OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.

Note that OAI works with a proven partner company to provide automation. The fully equipped 10000A-I-V is a high-performance inline & fully automated, with 2 x J/R (with 100 slots per cassette) manual Load Cassettes and automated conveyor system connected to single line, including three separate stations to perform I-V / AOI / EL inspection and 48 Bins Sorting at a tac time of 1.25sec and throughout of 2800WPH (best estimate). Both I-V and EL stations come with a glide mechanism to provide precise alignment of Si Solar Cells before they are placed under the busbar fixtures. The alignment option can also be upgraded with a camera vision system. The I-V station comes with 1 x Class A+AA 156mm Solar Simulator, Pogo pin type up to 4 – 5 (or multi) busbars station and Bar-code Reader. The AOI system comprises of CCD Camera (1024 x 1024 pixels) system to do color and defect imaging. The EL station comes with a busbar stage and is connected to the dedicated source meter for biasing the cells and High sensitive CCD Camera in the wavelength range of 900 to 1100 nm having little thermal noise, at a very suitable resolution of 1024 x 1024 pixels. The system also comes with Bernoulli Arm picking system to lift and sort the wafers in 40 x I-V + 6 x AOI and 2 x EL bins. The system can be further optimized and customized based on specific requirements.

FEATURES
• Automated I-V, AOI, EL and Sorting/Binning System for Full Size and CutCell Si Solar Cells
• Throughput of ~2800WPH
• Fast and reliable measurements with minimum contact resistance
• Measurement of up to 12 Busbar Si solar cells
• Specially designed thin Busbars to minimize the shadowing on Si solar cells
• Unique design for measuring Si Cutcells simultaneously using specially designed vacuum chuck and top busbar configuration
• Integration of Test Fixture with unique OAI I-V Rider Software, solar simulator and I-V measurement system

OUTSTANDING FEATURES

EL Imaging Tester

atomic — Thu, 09 Sep 2021 02:53:07 +0000

EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.